dc.contributor.author |
Retot, H. |
|
dc.contributor.author |
Bessiere, A. |
|
dc.contributor.author |
Viana, B. |
|
dc.contributor.author |
Galtayries, A. |
|
dc.date.accessioned |
2015-06-04T03:16:21Z |
|
dc.date.available |
2015-06-04T03:16:21Z |
|
dc.date.issued |
2011 |
|
dc.identifier.citation |
Journal of Applied Physics. 109(12); 2011; Article ID: 123518. |
en_US |
dc.identifier.uri |
http://dx.doi.org/10.1063/1.3597788 |
|
dc.identifier.uri |
http://irgu.unigoa.ac.in/drs/handle/unigoa/2661 |
|
dc.description.abstract |
The location of Ln(3+) dopant energy levels relative to bands in (Lu0.5Gd0.5)(2)O-3 was studied. A several-steps analysis of XPS measurements on heavy lanthanides sesquioxides Ln(2)O(3) (Ln = Gd, Tb, Dy, Er, Tm, Yb, Lu) and on Sc2O3 and Y2O3 reference materials were used to locate Ln(3+) dopant ground state relative to the top of the valence band in (Lu0.5Gd0.5)(2)O-3 within an error bar of +/-0.4 eV. The agreement between XPS data and model was found improved relative to previous studies. When compared to XPS analysis, prediction based on optical absorption shows a slight underestimation attributed to the lack of precision in Ce4+ charge transfer band measurement. |
en_US |
dc.publisher |
American Institute of Physics (AIP) |
en_US |
dc.subject |
Physics |
en_US |
dc.title |
Location of trivalent lanthanide dopant energy levels in (Lu0.5Gd0.5)(2)O-3 |
en_US |
dc.type |
Journal article |
en_US |
dc.identifier.impf |
y |
|