On the use of a silicon crystal in a cauchois-type bent crystal x-ray spectrograph

Abstract

The authors have studied the copper K absorption discontinuity in the metal and its oxides using a Cauchois-type bent crystal x-ray spectrograph equipped with a silicon crystal, along with a conventional x-ray source. The performance of the silicon crystal, which has been used for the first time in the Cauchois geometry in this study, is discussed.